Interface Physics


Papers published in 2011 


'Interlaboratory round robin on cantilever calibration for AFM force spectroscopy'

J. te Riet, A.J. Katan, C. Rankl, S.W. Stahl, A.M. van Buul, I.Y. Phang, A. Gomez-Casado, P. Schön, J.W. Gerritsen, A. Cambi, A.E. Rowan, G.J. Vancso, P. Jonkheijm, J. Huskens, T.H. Oosterkamp, H. Gaub, Hinterdorfer, C.G. Figor, S. Speller

Ultramicroscopy 111 (2011) 1659



'Magnetic resonance force microscopy of paramagnetic electron spins at millikelvin temperatures'
A. Vinante, G. Wijts, O. Usenko, L. Schinkelshoek, T.H. Oosterkamp

Nature Communications 2 (2011) 572



'Top-down approach to fiber-top cantilevers'
K.B. Gavan, J.H. Rector, K. Heeck, D. Chavan, G. Gruca, T.H. Oosterkamp, D. Iannuzzi

Appl. Phys. Lett. 98 (2011) 193103



'Surface structure and reactivity of Pd(100) during CO oxidation near ambient pressures'
R. van Rijn, O. Balmes, A. Resta, D. Wermeille, R. Westerström, J. Gustafson, R. Felici, E. Lundgren, J.W.M. Frenken

PCCP 13 (2011) 13167-13171

Reproduced by permission of the PCCP Owner Societies



'Deterministic nanoassembly of a coupled quantum emitter-photonic crystal cavity system'

T. van der Sar, J. Hagemeier, W. Pfaff, E.C. Heeres, S.M. Thon, H. Kim, P.M. Petroff, T.H. Oosterkamp, D. Bouwmeester, R. Hanson

Appl. Phys. Lett. 98 (2011) 193103



'Making carbon nanotube electron sources of defined lengths and with closed caps'

E.C. Heeres, T.H. Oosterkamp, N. de Jonge

Nanotechnology 22 (2011) 235308



'Oxidation and reduction of Pd(100) and aerosol-deposited Pd nanoparticles'
R. Westerström, M.E. Messing, S. Blomberg, A. Hellman, H. Grönbeck, J. Gustafson, N.M. Martin, O. Balmes, R. van Rijn, J.N. Andersen, K. Deppert, H. Bluhm, Z. Liu, M.E. Grass, M. Hävecker, E. Lundgren

Phys. Rev. B 83 (2011) 115440



'A superconducting quantum interference device based read-out of a subattonewton force sensor operating at millikelvin temperatures.'
O. Usenko, A. Vinante, G.H.J.C. Wijts, T.H. Oosterkamp

Appl. Phys. Lett. 98 (2011) 133105



'Reduction of interlayer thickness by low-temperature deposition of Mo/Si multilayer mirrors for X-ray reflection'

V.I.T.A. de Rooij-Lohmann, A.E. Yakshin, E. Zoethout, J. Verhoeven, F. Bijkerk

Appl. Surf. Sci. 257 (2011) 6251-6255



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